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Analog Front End
10.3
AFE architecture and theory of operation
Figure 10-1 provides an overview of the AFE architecture. This includes the following major functions:
? Analog-to-digital converter common to all sensor functions
? Accelerometer functions
— Transducer drive circuitry
— MEMS transducer
— Capacitance-to-voltage conversion and amplification
— Anti-aliasing filters for X, Y and Z dimensions
? Temperature sensor (9 mV/°C typical from -50 °C to 150 °C)
10.3.1
ADC operation
A conversion sequence is started when the AFE receives the “start ? A ” signal from the system integration
module.
The ADC covers a 1.8 V span, from -0.9 V to +0.9 V differential input. Individual sensor inputs are
prescaled to match this range.
The XYZ axis accelerations are converted during each analog Phase ? A . Optionally, either the internal
temperature sensor or external analog signal can be converted as a fourth measurement.
X
Transducer
Drive
Circuitry
Accelerometer
Transducer
C2V
Amplifier
Anti-
Aliasing
Filter
Y
ADC
Result
Registers
Z
Internal
Temperature
Sensor
REDONE
Differential
Inputs
AN1-AN0
External
Analog
Signal
State Machine
Figure 10-1. AFE data flow
The ADC contains a number of options to trade off power consumption versus resolution and accuracy.
Table 10-1 shows how resolution can be traded for reduced analog-phase duration. The options are lower
consumption or more time for the digital phase.
? “CM” bits are the Conversion-Mode bits from the AFE_CSR register. These control the target raw
resolution of the ADC conversion (10, 12, 14 or 16 bits).
MMA955xL Intelligent, Motion-Sensing Platform Hardware Reference Manual, Rev. 1.0
182
Freescale Semiconductor, Inc.
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